Paper
1 August 2017 Super-resolved thickness maps using ultrahigh resolution OCT
Valentin Aranha dos Santos, Leopold Schmetterer, Graham J. Triggs, Rainer A. Leitgeb, René M. Werkmeister
Author Affiliations +
Abstract
OCT imaging in the super-resolution regime was investigated using simulations and experiments. Samples of known thickness in the range 46-163 nm were fabricated and imaged. Measurements of the tear film lipid layer were performed.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Valentin Aranha dos Santos, Leopold Schmetterer, Graham J. Triggs, Rainer A. Leitgeb, and René M. Werkmeister "Super-resolved thickness maps using ultrahigh resolution OCT", Proc. SPIE 10416, Optical Coherence Imaging Techniques and Imaging in Scattering Media II, 1041606 (1 August 2017); https://doi.org/10.1117/12.2284530
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical coherence tomography

Signal processing

Super resolution

Back to Top