Recent advances in nano-scale spatial resolution x-ray microscopy instrumentation at NSLS-II

E. Nazaretski; Wei Xu; H. Yan; X. Huang; Weihe Xu; N. Bouet; J. Zhou; D. S. Coburn; L. Huang; Y. Yang; A. Kiss; M. Idir; Y. S. Chu

doi:10.1117/12.2595045

8 September 2021 Recent advances in nano-scale spatial resolution x-ray microscopy instrumentation at NSLS-II

E. Nazaretski, Wei Xu, H. Yan, X. Huang, Weihe Xu, N. Bouet, J. Zhou, D. S. Coburn, L. Huang, Y. Yang, A. Kiss, M. Idir, Y. S. Chu

Author Affiliations +

Proceedings Volume 11839, X-Ray Nanoimaging: Instruments and Methods V; 1183903 (2021) https://doi.org/10.1117/12.2595045
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States

Abstract

X-ray microscopy is an invaluable and powerful characterization tool applied in many scientific fields, such as materials science, biology, environmental science, and energy research. In recent years it has been driven by rapid developments of novel technologies and systems resulting in imaging experiments elucidating structural inhomogeneities and chemical reactions at the nanometer scale. To obtain high spatial resolution comprehensive chemical and structural information, an X-ray microscope must be equipped with adequate capabilities and allow for simultaneous acquisition of multiple datasets. In recent years, a number of X-ray microscopes have been designed, constructed, and commissioned at NSLS-II. Here we provide an overview of the microscopy instrumentation development program at NSLS-II and specifically focus on the multilayer Laue lens–based hard X-ray nanoprobe optimized for ~10 nm spatial resolution imaging, its current status, and future upgrades along with recently constructed Kirkpatrick-Baez based scanning microscope designed for ~100 nm spatial resolution experiments.

Conference Presentation

Citation Download Citation

E. Nazaretski, Wei Xu, H. Yan, X. Huang, Weihe Xu, N. Bouet, J. Zhou, D. S. Coburn, L. Huang, Y. Yang, A. Kiss, M. Idir, and Y. S. Chu "Recent advances in nano-scale spatial resolution x-ray microscopy instrumentation at NSLS-II", Proc. SPIE 11839, X-Ray Nanoimaging: Instruments and Methods V, 1183903 (8 September 2021); https://doi.org/10.1117/12.2595045

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