Automatic grain trait measurement via concave point detection and ellipse fitting

Zhonghua Jiang; Binbin Xiong; Yan Ma; Hexiao Huang

doi:10.1117/12.3026419

8 April 2024 Automatic grain trait measurement via concave point detection and ellipse fitting

Zhonghua Jiang, Binbin Xiong, Yan Ma, Hexiao Huang

Proceedings Volume 13090, International Conference on Computer Application and Information Security (ICCAIS 2023); 130901O (2024) https://doi.org/10.1117/12.3026419
Event: International Conference on Computer Application and Information Security (ICCAIS 2023), 2023, Wuhan, China

Abstract

Rice stands as one of the most crucial staple crops worldwide. The traits of rice grains are important indicators for evaluating grain quality. Traditional grain trait measurement methods rely on manual measurement by experts, which not only suffer from low efficiency but also are susceptible to individual subjectivity, resulting in compromised accuracy and stability. To address these issues, this paper proposes an automatic method for measuring grain trait. Firstly, the grain foreground is extracted using superpixel segmentation. Then, a concavity point detection algorithm based on a sliding circular model is employed to detect concavity points on the contours of grain connected regions. Multiple-round ellipse fitting is applied to segment individual grains. Finally, the grain trait parameters are obtained using the minimum bounding rectangle. Experimental trials were conducted on a grain image dataset consisting of three rice varieties: Huanghuazhan, Japonica, and Xiushui 134. Comparative analysis between the proposed algorithm and the SmartGrain software was performed to evaluate their performance. The experimental results demonstrate the robustness and high accuracy of the proposed method.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Zhonghua Jiang, Binbin Xiong, Yan Ma, and Hexiao Huang "Automatic grain trait measurement via concave point detection and ellipse fitting", Proc. SPIE 13090, International Conference on Computer Application and Information Security (ICCAIS 2023), 130901O (8 April 2024); https://doi.org/10.1117/12.3026419

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KEYWORDS

Image segmentation

Image processing

Detection and tracking algorithms

Image processing algorithms and systems

Binary data

Contour extraction

Adhesion

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