Large-angle incoherent structured light projector

Leonard H. Bieman; Mark A. Michniewicz

doi:10.1117/12.198839

6 January 1994 Large-angle incoherent structured light projector

Leonard H. Bieman, Mark A. Michniewicz

Proceedings Volume 2348, Imaging and Illumination for Metrology and Inspection; (1994) https://doi.org/10.1117/12.198839
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States

Abstract

Precision measurement using a projection moire system requires the projection of a high contrast grating pattern. This requirement is difficult to meet for very fine contour intervals. Either an extremely fine resolution image must be created or the grating must be projected at a large triangulation angle. The requirement for fine resolution imaging is difficult to achieve and still have significant depth range. Projection at a large triangulation angle using standard geometries, does not produce uniform magnification of the grating over the viewing field. We will present a unique geometry for achieving a large triangulation angle with uniform magnification of the grating over the viewing field.

Citation Download Citation

Leonard H. Bieman and Mark A. Michniewicz "Large-angle incoherent structured light projector", Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); https://doi.org/10.1117/12.198839

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