Development of an instrument for measuring yarn's structure parameters

Lin Liu; Bernard Durand

doi:10.1117/12.269847

20 March 1997 Development of an instrument for measuring yarn's structure parameters

Lin Liu, Bernard Durand

Proceedings Volume 2921, International Conference on Experimental Mechanics: Advances and Applications; (1997) https://doi.org/10.1117/12.269847
Event: International Conference on Experimental Mechanics: Advances and Applications, 1996, Singapore, Singapore

Abstract

Yarn structure parameters such as twist, hairiness and diameter have an important influence on its mechanical, thermal and dyeing properties. Up to now not any instrument can efficiently measure all these parameters together without destruction of yarn structure. Traditional measuring method involve many problems. For these reasons we developed for the first time a diffraction-reflection method to measure yarn core superficial fiber orientations by electro-optical and computer visualization technologies. Furthermore we also used diffraction method and yarn core shadow to determine respectively hairiness and yarn core diameter in two orthogonal views.

Citation Download Citation

Lin Liu and Bernard Durand "Development of an instrument for measuring yarn's structure parameters", Proc. SPIE 2921, International Conference on Experimental Mechanics: Advances and Applications, (20 March 1997); https://doi.org/10.1117/12.269847

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available