Optical-electronic pattern recognition system based on image-moment-features adaptive computation

Veacheslav L. Perju; Adrian V. Gurau; V. V. Perju

doi:10.1117/12.341308

9 March 1999 Optical-electronic pattern recognition system based on image-moment-features adaptive computation

Veacheslav L. Perju, Adrian V. Gurau, V. V. Perju

Proceedings Volume 3715, Optical Pattern Recognition X; (1999) https://doi.org/10.1117/12.341308
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

The new class of computer systems is presented, the architecture of which is controlled by parameters of the input images and based on usage of the adaptive moment image features (MIF) statistical analysis. Main types of MIF, as well as opportunity of their formation are described.

Citation Download Citation

Veacheslav L. Perju, Adrian V. Gurau, and V. V. Perju "Optical-electronic pattern recognition system based on image-moment-features adaptive computation", Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); https://doi.org/10.1117/12.341308

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