Paper
15 February 2008 Why InGaN laser-diode degradation is accompanied by the improvement of its thermal stability
L. Marona, P. Wiśniewski, M. Leszczyński, I. Grzegory, T. Suski, S. Porowski, R. Czernecki, A. Czerwinski, M. Pluska, J. Ratajczak, P. Perlin
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Abstract
In this paper we present reliability study of violet, InGaN based laser diodes grown on low dislocation density bulk GaN crystals. We observe two main phenomena responsible for degradation in our laser diodes. One of them is the increase of nonradiative recombination in quantum wells which is visible on cathodoluminescence images. The second mechanisms is connected to the increase of leakage current seems to be responsible for the observed evolution of the characteristic temperature of laser diodes.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Marona, P. Wiśniewski, M. Leszczyński, I. Grzegory, T. Suski, S. Porowski, R. Czernecki, A. Czerwinski, M. Pluska, J. Ratajczak, and P. Perlin "Why InGaN laser-diode degradation is accompanied by the improvement of its thermal stability", Proc. SPIE 6894, Gallium Nitride Materials and Devices III, 68940R (15 February 2008); https://doi.org/10.1117/12.762220
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Cited by 11 scholarly publications.
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KEYWORDS
Semiconductor lasers

Quantum wells

Gallium nitride

Indium gallium nitride

Diffusion

Reliability

Laser damage threshold

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