Two-photon fluorescence microscopy with differential aberration imaging

Kengyeh K. Chu; Aymeric Leray; Thomas G. Bifano; Jerome Mertz

doi:10.1117/12.812230

23 February 2009 Two-photon fluorescence microscopy with differential aberration imaging

Kengyeh K. Chu, Aymeric Leray, Thomas G. Bifano, Jerome Mertz

Proceedings Volume 7209, MEMS Adaptive Optics III; 720903 (2009) https://doi.org/10.1117/12.812230
Event: SPIE MOEMS-MEMS: Micro- and Nanofabrication, 2009, San Jose, California, United States

Abstract

We report our progress in the development of Differential Aberration Imaging (DAI), a technique that enhances twophoton fluorescence (TPEF) microscopy by improving rejection of out-of-focus background by means of a deformable mirror (DM). The DM is used to intentionally add aberrations to the imaging system, which causes dramatic losses to in-focus signal while preserving the bulk of the out-of-focus background. By taking the difference between TPEF images with and without added aberrations, the out-of-focus portion of the signal is further rejected. We now introduce an implementation of DAI using a new type of DM that can be produced at much lower cost.

Citation Download Citation

Kengyeh K. Chu, Aymeric Leray, Thomas G. Bifano, and Jerome Mertz "Two-photon fluorescence microscopy with differential aberration imaging", Proc. SPIE 7209, MEMS Adaptive Optics III, 720903 (23 February 2009); https://doi.org/10.1117/12.812230

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