A generic x-ray tracing toolbox in Geant4

Giuseppe Vacanti; Ernst-Jan Buis; Maximilien Collon; Marco Beijersbergen; Chris Kelly

doi:10.1117/12.821768

30 April 2009 A generic x-ray tracing toolbox in Geant4

Giuseppe Vacanti, Ernst-Jan Buis, Maximilien Collon, Marco Beijersbergen, Chris Kelly

Proceedings Volume 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space; 73600Z (2009) https://doi.org/10.1117/12.821768
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic

Abstract

We have developed a generic X-ray tracing toolbox based on Geant4, a generic simulation toolkit. By leveraging the facilities available on Geant4, we are able to design and analyze complex X-ray optical systems. In this article we describe our toolbox, and describe how it is being applied to support the development of silicon pore optics for IXO.

Citation Download Citation

Giuseppe Vacanti, Ernst-Jan Buis, Maximilien Collon, Marco Beijersbergen, and Chris Kelly "A generic x-ray tracing toolbox in Geant4", Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 73600Z (30 April 2009); https://doi.org/10.1117/12.821768

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available