Spectrum photoluminescence measuring system of porous silicon samples

T. F. Paes; A. F. Beloto; L. A. Berni; L. M. Silva

doi:10.1117/12.2021695

18 November 2013 Spectrum photoluminescence measuring system of porous silicon samples

T. F. Paes, A. F. Beloto, L. A. Berni, L. M. Silva

Proceedings Volume 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications; 8785A9 (2013) https://doi.org/10.1117/12.2021695
Event: 8th Ibero American Optics Meeting/11th Latin American Meeting on Optics, Lasers, and Applications, 2013, Porto, Portugal

Abstract

The porous silicon is a material made by monocrystalline silicon wafers which has a structure and properties that depends on the wafers characteristics and its obtaining process. The material has a use potential in different fields of knowledge and technological application such as solar cells, humidity or gases sensors. The photoluminescence, obtained by the incidence of ultraviolet radiation over the material, has been the most studied property, noting especially the understanding of chemical and physical phenomena present in this material that can even explain its formation process. This study aimed to build a spectrum measuring system of porous silicon photoluminescence to determine the profile of the porous silicon photoemission curve for comparison between the morphology of the porous silicon and its photoluminescence.

Citation Download Citation

T. F. Paes, A. F. Beloto, L. A. Berni, and L. M. Silva "Spectrum photoluminescence measuring system of porous silicon samples", Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 8785A9 (18 November 2013); https://doi.org/10.1117/12.2021695

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