Bidirectional scanning patterns in OCT allow for faster data acquisition with less mechanical strain on scanning components. However, the alternation in scanning direction could lead to phase drift between adjacent B-scans, due to hysteresis of the galvanometer or changes in the incident beam angle, causing errors for digital adaptive optics (DAO) methods. To overcome this limitation, we employed a phase bias estimation method, using bulk phase estimation (BPE) on de-interlaced bidirectional scans to calculate and compensate the systemic phase offset in alternating frames. The corrected scans are then re-interlaced, providing higher-quality DAO correction.
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