Dr. Akira Umeda
at Technology Research Association of Inertial Sensors
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 1 September 1998 Paper
Akihiro Ohta, Shekhar Bhansali, Isao Kishimoto, Akira Umeda
Proceedings Volume 3512, (1998) https://doi.org/10.1117/12.324049
KEYWORDS: Shape memory alloys, Sputter deposition, Titanium, Nickel, Silicon, Microelectromechanical systems, Crystals, Annealing, Temperature metrology, X-ray diffraction

Proceedings Article | 13 September 1996 Paper
Proceedings Volume 2880, (1996) https://doi.org/10.1117/12.250942
KEYWORDS: Sensors, Motion measurement, Reliability, Analytical research, Velocity measurements, Metrology, Standards development, Silicon, Magnetism, Surface roughness

Proceedings Article | 13 September 1996 Paper
Akira Umeda, Kazunaga Ueda
Proceedings Volume 2880, (1996) https://doi.org/10.1117/12.250943
KEYWORDS: Calibration, Interferometers, Motion measurement, Metrology, Reflection, Silicon, Manufacturing, Metals, Velocity measurements, Standards development

Proceedings Article | 13 September 1996 Paper
Akira Umeda, Kazunaga Ueda
Proceedings Volume 2880, (1996) https://doi.org/10.1117/12.250970
KEYWORDS: Interferometers, Laser development, Vibrometry, Reflection, Signal detection, Laser metrology, Wave propagation, Metals, Motion measurement, Transducers

Proceedings Volume Editor (1)

SPIE Conference Volume | 2 September 1997

Conference Committee Involvement (1)
Microlithography and Metrology in Micromachining III
29 September 1997 | Austin, TX, United States
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