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Boqun Li
at Shenzhen Univ
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 1 May 2014 Paper
Remote laboratory for phase-aided 3D microscopic imaging and metrology
Proceedings Volume 9132, 913205 (2014) https://doi.org/10.1117/12.2052068
KEYWORDS: 3D image processing, 3D metrology, Metrology, Imaging systems, Stereoscopy, Data storage, Cameras, Computer security, Computer networks, 3D image reconstruction
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