Dr. Myun-Sik Kim Profile

Dr. Myun-Sik Kim

Business Development & Product Manager at Axetris AG

SPIE Involvement:

Author

Area of Expertise:

High-resolution interference microscope (HRIM) , Interferometry , Talbot effect and Self-imaging effect , Micro-optics / Diffraction gratings , Solid immersion lens (SIL) , Photonic Nanojet

Websites:

Company Website

Profile Summary

Myun-Sik Kim received a Master degree on Mechatronics from Gwangju Institute of Science and Technology (GIST), Korea in 2004 and a PhD in Photonics from École Polytechnique Fédérale de Lausanne (EPFL), Switzerland, in 2011.
Since January 2019, he works at Axetris AG (Switzerland) as Senior Application Engineer. Axetris is a world’s leading manufacturer of microlenses and Micro-Optics. He is a senior member of the SPIE, and a member of the OSA (Optical society of America), EOS (European Optical Society), and OSK (Optical Society of Korea).

His expertise is “interferometry and metrology” and his research interests include interdisciplinary subjects in micro- and nano-fabrication and photonic systems.

He is the author of a book chapter edited by Prof. Emil Wolf, Progress in Optics volume 58, 2013, 25 peer-reviewed internal journals, 20 SPIE proceedings, and numerous conference presentations.

Publications (26)

Proceedings Article | 4 March 2019 Paper

Paper

Are photonic nanojets achromatic?

Michail Symeonidis, Myun-Sik Kim, Toralf Scharf

Proceedings Volume 10930, 109301C (2019) https://doi.org/10.1117/12.2509654

KEYWORDS: Optical spheres, Phase measurement, Photonic nanostructures, Image resolution, Wave propagation, Objectives, Colorimetry, Microscopes, Magnetism, Imaging systems

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Proceedings Article | 27 February 2019 Paper

Paper

Diffractive optical elements investigation in the phase domain

Michail Symeonidis, Dong Cheon Kim, Andreas Hermerschmidt, Myun-Sik Kim, Toralf Scharf

Proceedings Volume 10914, 109141W (2019) https://doi.org/10.1117/12.2509668

KEYWORDS: Phase measurement, Spiral phase plates, Diffraction, Diffractive optical elements, Silica, Objectives, Metrology, Microscopes, Photonics, Spectral resolution

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Proceedings Article | 14 March 2018 Presentation

Presentation

Photonic crystals for Bloch surface wave propagation based on lithium niobate thin films (Conference Presentation)

Tatiana Kovalevich, Djaffar Belharet, Laurent Robert, Thierry Grosjean, Myun-Sik Kim, Hans Peter Herzig, Maria-Pilar Bernal

Proceedings Volume 10544, 1054418 (2018) https://doi.org/10.1117/12.2309704

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Proceedings Article | 2 January 2018 Paper

Paper

Manipulation of Bloch surface waves: from subwavelength focusing to nondiffracting beam

Myun-Sik Kim, Hans Peter Herzig

Proceedings Volume 10456, 104561U (2018) https://doi.org/10.1117/12.2283194

KEYWORDS: Near field scanning optical microscopy, Photonics, Dielectrics, Near field, Diffraction gratings, Nondiffracting beams, Optical components, Diffraction

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Proceedings Article | 27 February 2017 Paper

Paper

Light fields behind microstructures: study of the Babinet-principle in the Fresnel regime

Toralf Scharf, Myun-Sik Kim, Krishnaparvathy Puthankovilakam, Hans Peter Herzig, Reinhard Voelkel

Proceedings Volume 10120, 1012010 (2017) https://doi.org/10.1117/12.2251379

KEYWORDS: Computer simulations, Objectives, Modulation, Distance measurement, Radio propagation, Electromagnetism, Diffraction, Near field diffraction, Interferometry, Electromagnetic radiation, Diffraction gratings, Singular optics, Polarization, Near field, Nanofabrication

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Proceedings Article | 20 February 2017 Presentation + Paper

Presentation + Paper

Scaling effect and its impact on wavelength-scale microlenses

Myun-Sik Kim, Toralf Scharf, Hans Peter Herzig, Reinhard Voelkel

Proceedings Volume 10116, 1011608 (2017) https://doi.org/10.1117/12.2256635

KEYWORDS: Microlens, Diffraction, Refraction, Lenses, Micro optics, Microelectromechanical systems, Optical components, Photonics, Geometrical optics, Optical spheres, Scattering, Glasses, Near field

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Proceedings Article | 16 February 2017 Presentation + Paper

Presentation + Paper

Near-field investigation of Bloch surface wave based 2D optical components

R. Dubey, B. Vosoughi Lahijani, M.-S. Kim, E. Barakat, M. Häyrinen, M. Roussey, M. Kuittinen, H. P. Herzig

Proceedings Volume 10106, 101061G (2017) https://doi.org/10.1117/12.2250394

KEYWORDS: Near field scanning optical microscopy, Resonators, Dielectrics, Integrated optics, Photonics, Near field optics, Finite-difference time-domain method, Heterodyning, Optical microscopy, Nanostructures, Optical components, Axicons, Multilayers, Near field, Dielectric polarization, Prisms

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Proceedings Article | 8 November 2016 Presentation

Presentation

Polarization controlled directional excitation of Bloch surface waves (Conference Presentation)

Tatiana Kovalevich, Philippe Boyer, Maria-Pilar Bernal, Myun-Sik Kim, Hans Peter Herzig, Thierry Grosjean

Proceedings Volume 9919, 991907 (2016) https://doi.org/10.1117/12.2248261

KEYWORDS: Dielectric polarization, Dielectrics, Photonic crystals, Electromagnetism, Interfaces, Surface plasmon polaritons, Silica, Integrated optics, Finite-difference time-domain method, Radio propagation

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Proceedings Article | 15 March 2016 Paper

Paper

Transition of optical regime in miniaturized optical systems: light interactions beyond the refraction limit

Myun-Sik Kim, Toralf Scharf, Carsten Rockstuhl, Wataru Nakagawa, Reinhard Voelkel, Hans Peter Herzig

Proceedings Volume 9760, 97600W (2016) https://doi.org/10.1117/12.2225366

KEYWORDS: Refraction, Photonic nanostructures, Optical components, Spherical lenses, Electromagnetic scattering, Diffraction, Mie scattering, Optical aberrations, Miniature imaging systems, Optical spheres, Photonics, Geometrical optics, Objectives, Silicon, Nanotechnology

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Proceedings Article | 4 March 2016 Paper

Paper

Structured amplitude and phase fields behind microstructures: the quest for high contrast modulation at proximity

Toralf Scharf, Myun-Sik Kim, Krishnaparvathy Puthankovilakam, Johana Bernasconi, Hans-Peter Herzig, Uwe Vogler, Reinhard Voelkel

Proceedings Volume 9764, 97640B (2016) https://doi.org/10.1117/12.2214341

KEYWORDS: Photomasks, Phase shift keying, Phase measurement, Modulation, Printing, Lithography, Neodymium, Diffraction, Stray light, Geometrical optics

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SPIE Journal Paper | 29 January 2016 Open Access

Open Access

Intensity and phase fields behind phase-shifting masks studied with high-resolution interference microscopy

Krishnaparvathy Puthankovilakam, Toralf Scharf, Myun-Sik Kim, Ali Naqavi, Hans Peter Herzig, Tina Weichelt, Uwe Zeitner, Uwe Vogler, Reinhard Voelkel

JM3, Vol. 15, Issue 02, 021203, (January 2016) https://doi.org/10.1117/12.10.1117/1.JMM.15.2.021203

KEYWORDS: Phase shifts, Photomasks, Printing, Phase measurement, Microscopy, Diffraction, Quartz, Semiconducting wafers, Resolution enhancement technologies

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Proceedings Article | 22 June 2015 Paper

Paper

Overview of characterization and metrology techniques for microlenses and microlens arrays

Myun-Sik Kim, Lisa Allegre, Jonathan Sunarjo, Wilfried Noell, Reinhard Voelkel

Proceedings Volume 9525, 95251D (2015) https://doi.org/10.1117/12.2183692

KEYWORDS: Microlens, Profilometers, Microlens array, Interferometers, Metrology, Objectives, Confocal microscopy, Wavefronts, Optical spheres, Manufacturing

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Proceedings Article | 10 March 2015 Paper

Paper

Interferometric study on Gouy phase anomaly of microlens array

Myun-Sik Kim, Toralf Scharf, Wilfried Noell, Hans Peter Herzig, Reinhard Voelkel

Proceedings Volume 9386, 93860Z (2015) https://doi.org/10.1117/12.2182201

KEYWORDS: Spherical lenses, Microlens, Phase shifts, Finite-difference time-domain method, Interferometry, Microlens array, Diffraction, Phase measurement, Phase shift keying, Micro optics

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SPIE Journal Paper | 24 September 2013 Open Access

Open Access

Publisher’s note: Light confinement effect of nonspherical nanoscale solid immersion lenses

Myun-Sik Kim, Toralf Scharf, David Nguyen, Ethan Keeler, Skyler Rydberg, Wataru Nakagawa, Gaël Osowiecki, Reinhard Voelkel, Hans Peter Herzig

JM3, Vol. 12, Issue 04, 041299, (September 2013) https://doi.org/10.1117/12.10.1117/1.JMM.12.4.041299

KEYWORDS: Solids, Lenses, Photonics, Micro optics, Microelectromechanical systems, Photonic devices, Computer engineering

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SPIE Journal Paper | 12 June 2013

Light confinement effect of nonspherical nanoscale solid immersion lenses

Myun-Sik Kim, Toralf Scharf, David Nguyen, Ethan Keeler, Skyler Rydberg, Wataru Nakagawa, Gaël Osowiecki, Reinhard Voelkel, Hans Peter Herzig

JM3, Vol. 12, Issue 02, 023015, (June 2013) https://doi.org/10.1117/12.10.1117/1.JMM.12.2.023015

KEYWORDS: Solids, Nanolithography, Lenses, Spherical lenses, Polymethylmethacrylate, Lithography, Electron beam lithography, Silicon, Microscopes, Objectives

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Proceedings Article | 13 May 2013 Paper

Paper

Optical characterization method for very small microlenses (sub-50 micron) for industrial mass-production applications

Myun-Sik Kim, Jonathan Sunarjo, Kenneth Weible, Reinhard Voelkel

Proceedings Volume 8788, 87880G (2013) https://doi.org/10.1117/12.2020589

KEYWORDS: Microlens, 3D metrology, Microlens array, Spherical lenses, Microscopes, Wavefronts, Confocal microscopy, Objectives, Image processing, Wafer-level optics

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Proceedings Article | 5 March 2013 Paper

Paper

Low-NA focused vortex beam lithography for below 100-nm feature size at 405 nm illumination

Myun-Sik Kim, Toralf Scharf, Hans Peter Herzig, Reinhard Voelkel

Proceedings Volume 8613, 86131A (2013) https://doi.org/10.1117/12.2002138

KEYWORDS: Lithography, Nanolithography, Polarizers, Polarization, Scanning electron microscopy, Dielectric polarization, Photoresist materials, Photomasks, Lithographic illumination, Solids

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Proceedings Article | 5 March 2013 Paper

Paper

Light confinement effect of non-spherical nanoscale solid immersion lenses

Myun-Sik Kim, Toralf Scharf, David Nguyen, Ethan Keeler, Skyler Rydberg, Wataru Nakagawa, Gaël Osowecki, Hans Peter Herzig, Reinhard Voelkel

Proceedings Volume 8613, 86131B (2013) https://doi.org/10.1117/12.2002145

KEYWORDS: Solids, Nanolithography, Spherical lenses, Polymethylmethacrylate, Electron beam lithography, Lithography, Lenses, Silicon, 3D metrology, Microscopes

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Proceedings Article | 5 May 2012 Paper

Paper

Advanced optical characterization of micro solid immersion lens

Myun-Sik Kim, Toralf Scharf, Mickael Brun, Segolene Olivier, Sergio Nicoletti, Hans Peter Herzig

Proceedings Volume 8430, 84300E (2012) https://doi.org/10.1117/12.921871

KEYWORDS: Beam shaping, Solids, Polarization, 3D metrology, Refractive index, Microscopes, Polarizers, Silica, Illumination engineering, Refraction

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Proceedings Article | 15 February 2012 Paper

Paper

Axial phase measurements of light interacting with microstructures

Myun-Sik Kim, Toralf Scharf, Hans Peter Herzig

Proceedings Volume 8250, 825007 (2012) https://doi.org/10.1117/12.905461

KEYWORDS: Phase measurement, Interferometry, Photonics, Phase velocity, Phase shifts, Optical spheres, 3D metrology, Microscopes, Light wave propagation, Wave propagation

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Proceedings Article | 11 February 2012 Paper

Paper

Generation of highly confined optical bottle beams by exploiting the photonic nanojet effect

Myun-Sik Kim, Toralf Scharf, Stefan Mühlig, Carsten Rockstuhl, Hans Peter Herzig

Proceedings Volume 8274, 82740U (2012) https://doi.org/10.1117/12.905459

KEYWORDS: Optical spheres, Photonic nanostructures, Gaussian beams, Wavefronts, Dielectrics, Illumination engineering, Mirrors, Bessel beams, Particles, Atmospheric particles

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Proceedings Article | 9 February 2012 Paper

Paper

Optical characterization of subwavelength-scale solid immersion lenses

Myun-Sik Kim, Toralf Scharf, Mohammad Tahdiul Haq, Wataru Nakagawa, Hans Peter Herzig

Proceedings Volume 8249, 82491B (2012) https://doi.org/10.1117/12.905472

KEYWORDS: Spherical lenses, Solids, Polymethylmethacrylate, Glasses, Polymers, Lithography, Electron beam lithography, 3D metrology, Interfaces, Near field optics

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Proceedings Article | 27 May 2011 Paper

Paper

Measuring amplitude and phase of light emerging from microstructures with HRIM

Toralf Scharf, Myun-Sik Kim, Hans Peter Herzig

Proceedings Volume 8082, 80821O (2011) https://doi.org/10.1117/12.895011

KEYWORDS: Diffraction, Diffraction gratings, Objectives, Phase measurement, Near field diffraction, Microscopy, 3D metrology, Image resolution, Charge-coupled devices, Distance measurement

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Proceedings Article | 17 January 2011 Paper

Paper

Photonic nanojet engineering: focal point shaping with scattering phenomena of dielectric microspheres

Myun-Sik Kim, Toralf Scharf, Stefan Mühlig, Carsten Rockstuhl, Hans Peter Herzig

Proceedings Volume 7941, 794115 (2011) https://doi.org/10.1117/12.887604

KEYWORDS: Optical spheres, Wavefronts, Photonic nanostructures, Spherical lenses, Bessel beams, Objectives, Wave propagation, Illumination engineering, Diffraction, Scattering

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Proceedings Article | 17 September 2008 Paper

Paper

Refractive statistical concave 1D diffusers for laser beam shaping

Roland Bitterli, Myunsik Kim, Toralf Scharf, Hans-Peter Herzig, Andreas Bich, Christine Dumouchel, Sylvain Roth, Reinhard Völkel, K. Weible

Proceedings Volume 7062, 70620P (2008) https://doi.org/10.1117/12.793605

KEYWORDS: Diffusers, Photomasks, Etching, Diffusion, Silica, Data modeling, Microlens, Isotropic etching, Spherical lenses, Optical components

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Proceedings Article | 21 April 2006 Paper

Paper

Parallel atomic force microscopy using optical heterodyne detection

Laura Chantada, Myun-Sik Kim, Omar Manzardo, René Dändliker, Laure Aeschimann, Urs Staufer, Peter Vettiger, Kenneth Weible, Hans Peter Herzig

Proceedings Volume 6186, 61860B (2006) https://doi.org/10.1117/12.664452

KEYWORDS: Heterodyning, Atomic force microscopy, Michelson interferometers, Interferometers, Beam splitters, Binary data, Bragg cells, Photodetectors, Signal detection, Atomic force microscope

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Showing 5 of 26 publications

Conference Committee Involvement (1)

Frontiers in Optics (FIO) 2011

16 October 2011 |

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