Dr. Vincent De Andrade Profile

Dr. Vincent De Andrade

at Argonne National Lab

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Author

Publications (8)

Proceedings Article | 8 September 2021 Presentation + Paper

Design of the in situ nanoprobe beamline at the Advanced Photon Source

Jörg Maser, Vincent De Andrade, Steven Kearney, Jonathan Knopp, Barry Lai, Tim Mooney, Curt Preissner, Luca Rebuffi, Ruben Reininger, Oliver Schmidt, Xianbo Shi, Christian Roehrig, Deming Shu, Si Chen

Proceedings Volume 11839, 1183905 (2021) https://doi.org/10.1117/12.2596609

KEYWORDS: Diffraction, Magnetism, X-ray sources, Satellites, Monochromators

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Proceedings Article | 1 August 2021 Presentation

Reconstruction with nonrigid alignment in tomography and 3D ptychography

Viktor Nikitin, Vincent De Andrade, Doga Gursoy, Francesco De Carlo

Proceedings Volume 11839, 118390H (2021) https://doi.org/10.1117/12.2594889

KEYWORDS: Tomography, Spatial resolution, Microscopes, Image resolution, X-rays, X-ray imaging, Tolerancing, Statistical analysis, Optical flow, Nanoprobes

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Proceedings Article | 17 September 2019 Presentation

Operando multimodal x-ray tomography of transport in electrochemical energy-conversion and storage devices (Conference Presentation)

Iryna Zenyuk, Andrew Shum, Emily Leonard, Vincent De Andrade, Dilworth Parkinson, Xianghui Xiao

Proceedings Volume 11113, 111130Y (2019) https://doi.org/10.1117/12.2530007

KEYWORDS: X-rays, Tomography, X-ray computed tomography, Carbon, Humidity, Liquids, 3D image processing, Synchrotrons, Polymers, Physical phenomena

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Proceedings Article | 9 September 2019 Paper

Mechanical design of a flexural nanopositioning stage system for hard x-ray nanofocusing at the Advanced Photon Source 32-ID-C station

Deming Shu, Vincent De Andrade, Jayson Anton, Steven Kearney, Kamel Fezzaa, Sunil Bean, Alex Deriy, Wenjun Liu, Jorg Maser, Barry Lai, Jonathan Tischler, Francesco De Carlo

Proceedings Volume 11112, 111120N (2019) https://doi.org/10.1117/12.2529384

KEYWORDS: Mechanical engineering, Hard x-rays, X-rays, Mirrors, Nanoprobes, Microscopes, Spatial resolution, X-ray microscopy, Microscopy, Finite element methods

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Proceedings Article | 30 August 2019 Presentation + Paper

Optomechanical design of a portable metrology system for measurement of precision rotary stage errors

Steven Kearney, Deming Shu, Vincent De Andrade, Jörg Maser

Proceedings Volume 11100, 1110005 (2019) https://doi.org/10.1117/12.2528915

KEYWORDS: Sensors, Metrology, Optical alignment, Interferometers, Error analysis, Optomechanical design, Precision measurement, Tomography, Nanoprobes, Mechanical engineering

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Proceedings Article | 3 November 2016 Presentation

X-ray induced chemical reaction revealed by in-situ X-ray diffraction and scanning X-ray microscopy in 15 nm resolution (Conference Presentation)

Mingyuan Ge, Wenjun Liu, David Bock, Vincent De Andrade, Hanfei Yan, Xiaojing Huang, Amy Marschilok, Esther Takeuchi, Huolin Xin, Yong Chu

Proceedings Volume 9927, 99270H (2016) https://doi.org/10.1117/12.2237229

KEYWORDS: X-rays, Chemical reactions, X-ray diffraction, X-ray microscopy, Synchrotrons, Electrodes, Electron microscopy, Temperature metrology, Germanium, Nanoengineering

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Proceedings Article | 2 November 2016 Presentation

A new transmission x-ray microscope for in-situ nano-tomography at the APS (Conference Presentation)

Vincent De Andrade, Alex Deriy, Michael Wojcik, Doga Gürsoy, Deming Shu, Tim Mooney, Kevin Peterson, Arthur Glowacki, Ke Yue, Xiaogang Yang, Rafael Vescovi, Francesco De Carlo

Proceedings Volume 9967, 99670H (2016) https://doi.org/10.1117/12.2239449

KEYWORDS: X-rays, Microscopes, Materials science, Spatial resolution, Zone plates, Systems engineering, Software development, Reconstruction algorithms, Data acquisition, 3D acquisition

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Proceedings Article | 23 September 2011 Paper

Simulation and optimization of the NSLS-II SRX beamline combining ray-tracing and wavefront propagation

Vincent De Andrade, Juergen Thieme, Oleg Chubar, Mourad Idir

Proceedings Volume 8141, 81410L (2011) https://doi.org/10.1117/12.894954

KEYWORDS: Mirrors, Crystals, Optical simulations, X-rays, Nanoprobes, Diffraction, X-ray optics, Wavefronts, Wave propagation, Optical components

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Showing 5 of 8 publications

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