We report an optical pulse profiling method which has a potential to enable real-time stamping of optical pulse waveforms to corresponding characteristic spectra without any user's expertise and skills. Its performance was confirmed by comparison with the conventional matured measurement tools and was as accurate as the conventional ones. The concept can be extended for real-time measurement of pulse-by-pulse phenomena provided the use of fast spectrum analyzers enables to acquire and storage pulse-by-pulse spectrum in real-time.
Tsuyoshi Konishi, Yu Yamasaki, and Tomotaka Nagashima, "Optical pulse waveform profiling through real-time stamping to corresponding characteristic spectra," Proc. SPIE 10089, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications II, 1008909 (Presented at SPIE LASE: January 30, 2017; Published: 22 February 2017); https://doi.org/10.1117/12.2256482.
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