We developed a method to extract information of 3-dimensional coherent fields using projective measurements. We are particularly interested in 3-dimensional fields that are produced by the intersection of two orthogonally polarized light beams. We find that for specific symmetric conditions we are able to deduce the 3-dimensional polarization ellipse of the every point in space.
Enrique J. Galvez and Ishir Dutta, "Deducing 3-dimensional polarization fields from projective measurements," Proc. SPIE 10120, Complex Light and Optical Forces XI, 101200B (Presented at SPIE OPTO: January 31, 2017; Published: 27 February 2017); https://doi.org/10.1117/12.2253281.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon