Unmanned aerial systems (UAS) are increasing in flight times, ease of use, and payload sizes. Detection, classification, tracking, and neutralization of UAS is a necessary capability for infrastructure and facility protection. We discuss test and evaluation methodology developed at Sandia National Laboratories to establish a consistent, defendable, and unbiased means for evaluating counter unmanned aerial system (CUAS) technologies. The test approach described identifies test strategies, performance metrics, UAS types tested, key variables, and the necessary data analysis to accurately quantify the capabilities of CUAS technologies. The tests conducted, as defined by this approach, will allow for the determination of quantifiable limitations, strengths, and weaknesses in terms of detection, tracking, classification, and neutralization. Communicating the results of this testing in such a manner informs decisions by government sponsors and stakeholders that can be used to guide future investments and inform procurement, deployment, and advancement of such systems into their specific venues.
C. Kouhestani, B. Woo, and G. Birch, "Counter unmanned aerial system testing and evaluation methodology," Proc. SPIE 10184, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security, Defense, and Law Enforcement Applications XVI, 1018408 (Presented at SPIE Defense + Security: April 10, 2017; Published: 5 May 2017); https://doi.org/10.1117/12.2262538.
Conference Presentations are recordings of oral presentations given at SPIE conferences and published as part of the conference proceedings. They include the speaker's narration along with a video recording of the presentation slides and animations. Many conference presentations also include full-text papers. Search and browse our growing collection of more than 14,000 conference presentations, including many plenary and keynote presentations.
Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon