The SAL simulation tool Laider Tracer models speckle: the random variation in intensity of an incident light beam across a rough surface. Within Laider Tracer, the speckle field is modeled as a 2-D array of jointly Gaussian random variables projected via ray tracing onto the scene of interest. Originally, all materials in Laider Tracer were treated as ideal diffuse scatterers, for which the far-field return computed uses the Lambertian Bidirectional Reflectance Distribution Function (BRDF). As presented here, we implement material properties into Laider Tracer via the Non-conventional Exploitation Factors Data System: a database of properties for thousands of different materials sampled at various wavelengths and incident angles. We verify the intensity behavior as a function of incident angle after material properties are added to the simulation.
Jacob W. Ross, Brian D. Rigling, and Edward A. Watson, "Analysis of speckle and material properties in laider tracer," Proc. SPIE 10201, Algorithms for Synthetic Aperture Radar Imagery XXIV, 1020102 (Presented at SPIE Defense + Security: April 13, 2017; Published: 28 April 2017); https://doi.org/10.1117/12.2261157.
Conference Presentations are recordings of oral presentations given at SPIE conferences and published as part of the proceedings. They include the speaker's narration with video of the slides and animations. Most include full-text papers. Interactive, searchable transcripts and closed captioning are now available for 2018 presentations, with transcripts for prior recordings added daily.
Search our growing collection of more than 16,000 conference presentations, including many plenaries and keynotes.