Scene simulations of optical signature properties using signature codes normally requires input of various parameterized
measurement data of surfaces and coatings in order to achieve realistic scene object features. Some of the most important
parameters are used in the model of the Bidirectional Reflectance Distribution Function (BRDF) and are normally
determined by surface reflectance and scattering measurements. Reflectance measurements of the spectral Directional
Hemispherical Reflectance (DHR) at various incident angles can normally be performed in most spectroscopy labs,
while measuring the BRDF is more complicated or may not be available at all in many optical labs. We will present a
method in order to achieve the necessary BRDF data directly from DHR measurements for modeling software using the
Sandford-Robertson BRDF model. The accuracy of the method is tested by modeling a test surface by comparing results
from using estimated and measured BRDF data as input to the model. These results show that using this method gives no
significant loss in modeling accuracy.
Tomas Hallberg, Anna Pohl, and Jan Fagerström, "Simplifying BRDF input data for optical signature modeling," Proc. SPIE 10206, Disruptive Technologies in Sensors and Sensor Systems, 102060V (Presented at SPIE Defense + Security: April 12, 2017; Published: 2 May 2017); https://doi.org/10.1117/12.2262115.
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