From Event: SPIE Commercial + Scientific Sensing and Imaging, 2017
Polarization is a unique property of light, providing a number of advantages in optical metrology. In this talk, I will discuss principles and experimental results of polarization techniques in fringe project metrology and interferometric measurement.
Rongguang Liang, "Polarized metrology systems (Conference Presentation)," Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 1022002 (Presented at SPIE Commercial + Scientific Sensing and Imaging: April 13, 2017; Published: 6 June 2017); https://doi.org/10.1117/12.2264881.5460687076001.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon