From Event: SPIE Commercial + Scientific Sensing and Imaging, 2017
Gaps are important in a wide range of measurements in manufacturing, from the fitting of critical assemblies too cosmetic features on cars. There are a variety of potential sensors that can measure a gap opening, each with aspects of gap measurements that they do well and other aspects where the technology may lack capability. This paper provides a review of a wide range of optical gages from structured light to passive systems and from line to area measurement. Each technology is considered relative to the ability to accurately measure a gap, including issues of edge effects, edge shape, surface finish, and transparency. Finally, an approach will be presented for creating an optimize measurement off gap openings for critical assembly applications.
Kevin Harding and Rajesh Ramamurthy, "Optimized measurement of gaps," Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 102200E (Presented at SPIE Commercial + Scientific Sensing and Imaging: April 13, 2017; Published: 1 May 2017); https://doi.org/10.1117/12.2261187.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon