Experimental researches using high power optical lasers combined with free electron lasers (FELs) open new frontiers in high energy density (HED) sciences. Probing and pumping capabilities are dramatically improved due to the brightness of the XFEL pulses with ultrafast duration. Besides, the peak intensities of Ti:sapphire laser Chirped Pulse Amplification (CPA) systems reach petawatt (PW)-class with operating in few tens of fs and commercially available at a few Hz of repetition rate. We have been developing an experimental platform for HED sciences using high power, high intensity optical lasers at the XFEL facility, SACLA.Currently, an experimental platform with a dual 0.5 PW Ti:Sapphire laser system is under beam commissioning for experiments combined with the SACLA’s x-ray beam for research objectives that require more peak power in the optical laser pulses with a few tens of fs. The optical laser system is designed to deliver two laser beams simultaneously with the maximum power of 0.5 PW in each into a target chamber located in an experimental hutch 6 (EH6) at BL2, which was recently commissioned as a SACLA’s 2nd hard x-ray beamline. A focusing capability using sets of compound refractive lenses will be applied to increase the x-ray fluence on the target sample. One of the most key issues for the integrated experimental platform is development of diagnostics that meets requirements both from the high power laser (e.g. resistance to harsh environments) and from the XFEL (e.g. adaptation to the available data acquisition system). The status and future perspective of the development including automatic laser alignment systems will be reported in the presentation. We will discuss the most promising and important new physics experiments that will be enabled by the combination of PW-class lasers and the world-class FEL’s x-ray beam.
Hiromitsu Tomizawa, "Bringing PW-class lasers to XFELs (Conference Presentation)," Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 102370X (Presented at SPIE Optics + Optoelectronics: April 28, 2017; Published: 16 June 2017); https://doi.org/10.1117/12.2269303.5463398584001.
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