We present an integrated optical wavelength meter based on a Si3N4/SiO2 micro ring resonator (operating over a free spectral range of ≈ 2.6 nm) whose output response is immune to temperature changes. The wavelength meter readout is performed by a neural network and a non-linear optimization algorithm. This novel approach ensures a high wavelength estimation precision (≈ 50 pm). We observe a long-term reproducibility of the wavelength meter response over a time interval of one week. We investigate the influence of the ambient temperature on the estimated wavelength. We observe an immunity of the displayed output wavelength to temperature changes of up to several degrees. The temperature-drift immunity appears to be caused by deviations from the theoretically expected (perfect) transmission function of a ring resonator, i.e., caused by deviations that are usually undesired in spectroscopic devices.
Caterina Taballione, Temitope Agbana, Gleb Vdovin, Marcel Hoekman, Lennart Wevers, Jeroen Kalkman, Michel Verhaegen, Peter J.M. van der Slot, and Klaus-Jochen Boller, "Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator," Proc. SPIE 10242, Integrated Optics: Physics and Simulations III, 1024206 (Presented at SPIE Optics + Optoelectronics: April 24, 2017; Published: 17 May 2017); https://doi.org/10.1117/12.2265604.
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