From Event: SPIE Optical Engineering + Applications, 2017
When fringe projection profilometry is used for measuring rough/textured surfaces, the fidelity of the measurement is subject to the spatial frequency response. The instrument transfer function (ITF) is one appealing approach to characterize this property. The foundation of ITF analysis is based on the linear theory; only linear systems are appropriate for ITF analysis. A fringe projection system is intrinsically nonlinear, but it can be approximated as a linear system when certain conditions are met. Here we investigate the linear conditions of a custom fringe projection system designed for an additive manufacturing application. The applicability of ITF is discussed through mathematical analysis and simulations.
Bin Zhang, Angela Davies, John Ziegert, and Christopher Evans, "Application of instrument transfer function to a fringe projection system for measuring rough surfaces," Proc. SPIE 10373, Applied Optical Metrology II, 103730S (Presented at SPIE Optical Engineering + Applications: August 09, 2017; Published: 23 August 2017); https://doi.org/10.1117/12.2275892.
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