From Event: SPIE Optical Engineering + Applications, 2017
A scanning pattern projection technique for 3D shape measurements is proposed. A binary grid pattern is employed as the projected pattern. The limited depth-of-focus of the pattern projection system makes the surface on the focused area can be clearly observed. Thus, a 2D contour of the inspected surface addressed by the in-focused fringes was obtained. By assembling the surface contours with their corresponding depths, the 3D shape of the object cab retrieved.
Nai-Jen Cheng and Wei-Hung Su, "A scanning approach using a binary grid pattern for 3D shape measurements," Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820N (Presented at SPIE Optical Engineering + Applications: August 07, 2017; Published: 23 August 2017); https://doi.org/10.1117/12.2275327.
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