From Event: SPIE Optical Engineering + Applications, 2017
A one-shot profilometry for surfaces with color or reflectivity discontinuties is presented. It uses binary-encoded pattern to illuminate the inspected object and a monochromatic camera to observe the deformed fringes at another view angle. The encoded pattern provides additional to identify the fringe order. For spatially isolated objects or surfaces with large depth discontinuities, unwrapping can be identified without ambiguity. Even though the surface color or reflectivity varies rapidly with position, it distinguishes the fringe order as well.
Wei-Hung Su and Sih-Yue Chen, "One shot profile measurements using a binary-encoded pattern," Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820T (Presented at SPIE Optical Engineering + Applications: August 07, 2017; Published: 23 August 2017); https://doi.org/10.1117/12.2275322.
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