From Event: SPIE Optical Engineering + Applications, 2017
A fringe projection profilometry is presented. It uses the phase-shifting technique perform the phase-extraction and use the ternary-encoded patterns to identify the fringe orders. Only five-shot measurements are required for data processing. Experiments show that absolute phases could be obtained with high reliability.
Sih-Yue Chen, Nai-Jen Cheng, and Wei-Hung Su, "Phase-shifting projected fringe profilometry using ternary-encoded patterns," Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820U (Presented at SPIE Optical Engineering + Applications: August 07, 2017; Published: 23 August 2017); https://doi.org/10.1117/12.2275325.
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