From Event: SPIE Optical Engineering + Applications, 2017
Advanced analysis and modelling methods has been an essential part of X-ray optics advances and X-ray techniques development at synchrotron light sources. These methods not only help researchers develop designs of X-ray sources and beamlines, diagnose and identify problems and issues in operations, but also enable advanced modelling and simulations of novel X-ray optics and experiments. Recent development rends in diffraction-limited sources and in coherence applications further illustrate the community interests and increased needs in advanced wavefront-based analysis and modelling capabilities. This presentation will provide an overview of this growing area of X-ray optics and techniques and its impact on synchrotron science in general.
Qun Shen, "Computational methods in development of modern synchrotrons and their applications (Conference Presentation)," Proc. SPIE 10388, Advances in Computational Methods for X-Ray Optics IV, 1038803 (Presented at SPIE Optical Engineering + Applications: August 09, 2017; Published: 25 January 2018); https://doi.org/10.1117/12.2276693.5589299476001.
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