From Event: SPIE Optical Engineering + Applications, 2017
With the progress of achieving diffraction-limited X-ray focus, ptychography offers a unique and powerful tool to provide quantitative reconstruction of the complex-valued wavefront of a focused beam. Propagation of the reconstructed wavefront essentially describes complete performance characterization of the optics. We will present the accumulated efforts at NSLS-II on exploring the capability of ptychography to quantify focusing performance of a variety of hard X-ray optics, including K-B mirrors, zone plates, multilayer Laue lenses [1-3]. Presentation will also elaborate on our recent development of monolithically bonded MLLs as a signal optical component for scanning probe microscope applications [4,5].
 X. Huang, et al., “Quantitative X-ray wavefront measurements of Fresnel zone plate and K-B mirrors using phase retrieval”, Optics Express, 20, 24038-24048 (2012).
 X. Huang, et al., “11 nm hard X-ray focus from a large-aperture multilayer Laue lens”, Scientific Reports, 3, 3562 (2013).
 X. Huang, et al., “Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens”, Optics Express, 23, 12496-12507 (2015).
 E. Nazaretski, et al., “Development and characterization of monolithic multilayer Laue lens nanofocusing optics"”, Applied Physics Letters, 108, 261102 (2016).
 X. Huang, et al., “Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses”, submitted, (2017).
Xiaojing Huang, Hanfei Yan, Evgeny Nazaretski, Mingyuan Ge, Nathalie Bouet, Juan Zhou, Weihe Xu, Petr P. Ilinski, and Yong S. Chu, "Nano-focused hard x-ray beam measured by ptychography (Conference Presentation)," Proc. SPIE 10388, Advances in Computational Methods for X-Ray Optics IV, 103880O (Presented at SPIE Optical Engineering + Applications: August 10, 2017; Published: 25 September 2017); https://doi.org/10.1117/12.2274832.5588453691001.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon