From Event: SPIE Optical Engineering + Applications, 2017
In X-ray computed tomography (CT), scattered radiation plays an important role in the accurate reconstruction of the inspected object, leading to a loss of contrast between the different materials in the reconstruction volume and cupping artifacts in the images. We present a Monte Carlo simulation tool for spectral X-ray CT to predict the scattered radiation generated by complex samples. An experimental setup is presented to isolate the energy distribution of scattered radiation. Spectral CT is a novel technique implementing photon-counting detectors able to discriminate the energy of incoming photons, enabling spectral analysis of X-ray images. This technique is useful to extract efficiently more information on energy dependent quantities (e.g. mass attenuations coefficients) and study matter interactions (e.g. X-ray scattering, photoelectric absorption, etc...). Having a good knowledge of the spectral distribution of the scattered X-rays is fundamental to establish methods attempting to correct for it. The simulations are validated by real measurements using a CdTe spectral resolving detector (Multix ME-100). We observed the effect of the scattered radiation on the image reconstruction, becoming relevant in the energy range where the Compton events are dominant (i.e. above 50keV).
Matteo Busi, Ulrik L. Olsen, Erik B. Knudsen, Jeppe R. Frisvad, Jan Kehres, Erik D. Christensen, Mohamad Khalil, and Kristoffer Haldrup, "A Monte Carlo simulation of scattering reduction in spectral x-ray computed tomography," Proc. SPIE 10388, Advances in Computational Methods for X-Ray Optics IV, 103880P (Presented at SPIE Optical Engineering + Applications: August 10, 2017; Published: 23 August 2017); https://doi.org/10.1117/12.2273763.
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