From Event: SPIE Optical Engineering + Applications, 2017
Nano-focused hard X-ray probe offers a suite of analytic tools for quantitative characterization of specimen under investigation. Scanning probe operated in a multi-modality imaging mode evokes fluorescence, absorption, phase contrasts, and potentially diffraction contrast as well. Without introducing extra instrumental complexity, ptychography technique can be seamlessly integrated into the scanning probe imaging system, since it shares the same data collection procedure and even shares the exactly the same dataset with absorption- and differential-phase-contrast imaging. We will present our implementation of ptychography method for nano-Mii (Nanoscale Multimodality Imaging Instrument) at the Hard X-ray Nanoprobe (HXN) Beamline of the National Synchrotron Light Source II (NSLS-II). The ptychography reconstruction assist aligning optics to achieve diffraction-limited focus and provide quantitative images with enhanced resolution. The on-the-fly operation mode maximizes the experimental throughput, and make it timely realistic to conduct three-dimensional high-resolution imaging.
Xiaojing Huang, Hanfei Yan, Evgeny Nazaretski, Mingyuan Ge, Nathalie Bouet, Juan Zhou, Petr P. Ilinski, and Yong S. Chu, "Integration of ptychography with the nanoscale multimodality imaging instrument at HXN of NSLS-II (Conference Presentation)," Proc. SPIE 10389, X-Ray Nanoimaging: Instruments and Methods III, 103890B (Presented at SPIE Optical Engineering + Applications: August 07, 2017; Published: 29 September 2017); https://doi.org/10.1117/12.2272577.5593178779001.
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