From Event: SPIE Optical Engineering + Applications, 2017
The goal of this paper is to outline the process for characterizing the S-parameters of passive two-port electrical
devices to calculate the input signal from a measured output signal when standard two-port VNA measurements are
not possible. For long cables such as those used at NIF to transmit analog electrical signals long distances from target
diagnostics to their respective data digitizer, standard two-port VNA measurements cannot be used to determine the
cables’ transfer functions due to the large physical separations between the ports of the cables. Traditionally, this
problem was addressed by recording input and output waveforms with two oscilloscopes and then comparing their
spectral composition. A new method is to take reflection measurements at one port and substitute three known loads
at the other port to generate a system of simultaneous equations that will allow for S21 to be quantified.
A. Wargo, B. V. Beeman, C. Brown, and P. Bell, "Signal de-embedding when standard two-port VNA measurements are not possible," Proc. SPIE 10390, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion VI, 1039004 (Presented at SPIE Optical Engineering + Applications: August 08, 2017; Published: 6 September 2017); https://doi.org/10.1117/12.2275593.
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