From Event: SPIE Optical Engineering + Applications, 2017
Sandia National Laboratories has recently developed the capability to acquire multi-channel radio-
graphs for multiple research and development applications in industry and security. This capability
allows for the acquisition of x-ray radiographs or sinogram data to be acquired at up to 300 keV
with up to 128 channels per pixel. This work will investigate whether multiple quality metrics for
computed tomography can actually benefit from binned projection data compared to traditionally
acquired grayscale sinogram data. Features and metrics to be evaluated include the ability to dis-
tinguish between two different materials with similar absorption properties, artifact reduction, and
signal-to-noise for both raw data and reconstructed volumetric data. The impact of this technology
to non-destructive evaluation, national security, and industry is wide-ranging and has to potential
to improve upon many inspection methods such as dual-energy methods, material identification,
object segmentation, and computer vision on radiographs.
Edward S. Jimenez, Kyle R. Thompson, Adriana Stohn, and Ryan N. Goodner, "Leveraging multi-channel x-ray detector technology to improve quality metrics for industrial and security applications," Proc. SPIE 10393, Radiation Detectors in Medicine, Industry, and National Security XVIII, 103930G (Presented at SPIE Optical Engineering + Applications: August 09, 2017; Published: 26 September 2017); https://doi.org/10.1117/12.2275850.
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