From Event: SPIE Optical Engineering + Applications, 2017
To measure X-ray spectra with high count rates, we developed a detector consisting of a cerium-doped yttrium aluminum perovskite [YAP(Ce)] crystal and a recent multipixel photon counter (MPPC). Scintillation photons are detected using the MPPC, and the photocurrents flowing through the MPPC are converted into voltages and amplified using a high-speed current-voltage (I-V) amplifier. The MPPC bias voltage was set to a value at the pre-Geiger mode to perform zero-dark counting. The event-pulse widths were approximately 200 ns, and the widths were extend to approximately 1 μs. X-ray spectra were measured using a multichannel analyzer (MCA) for pulse-height analysis. The photon energy was roughly determined by the two-point calibration using tungsten K photons and iodine K fluorescence. Using the YAP(Ce)-MPPC detector, first-generation dual-energy computed tomography was accomplished using iodine and gadolinium contrast media.
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