From Event: SPIE Optical Engineering + Applications, 2017
The Rutherford Appleton Laboratory’s HEXITEC ASIC has been designed to provide fine pixelated X-ray spectroscopic imaging in combination with a CdTe or CZT detector layer. Although HEXITEC’s small pixels enable higher spatial resolution as well as higher spectral resolution via the small-pixel effect, they also increase the probability of charge sharing, a process which degrades spectral performance by dividing the charge induced by a single photon among multiple pixels. In this paper, we investigate the effect of this process on a continuum X-ray spectrum below the Cd and Te fluorescence energies (23 keV). This is done by comparing laboratory measurements with simulations performed with a custom designed model of the HEXITEC ASIC. We find that the simulations closely match the observations implying that we have an adequate understanding of both charge sharing and the HEXITEC ASIC itself. These results can be used to predict the distortion of a spectrum measured with HEXITEC and will help determine to what extent it can be corrected. They also show that models like this one are important tools in developing and interpreting observations from ASICs like HEXITEC.
Daniel F. Ryan, Steven D. Christe, Albert Y. Shih, Wayne H. Baumgartner, Matthew D. Wilson, Paul Seller, Jessica A. Gaskin, and Andrew Inglis, "Modeling and measuring charge sharing in hard x-ray imagers using HEXITEC CdTe detectors," Proc. SPIE 10397, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XX, 1039702 (Presented at SPIE Optical Engineering + Applications: August 06, 2017; Published: 29 August 2017); https://doi.org/10.1117/12.2274419.
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