From Event: SPIE Optical Engineering + Applications, 2017
We present continued development of components for measuring linear X-ray polarization over the 0.2-0.8 keV (15-62 Angstrom) band. We present results from measurements of new laterally graded multilayer mirrors and critical angle transmission gratings essential to the approach. While the lab is designed to verify components to be used in a soft X-ray polarimeter, it is reconfigurable and has been used to verify grating efficiencies with our new CCD detector. Our development work is the basis for a sounding rocket mission (Rocket Experiment Demonstration of a Soft X-ray Polarimeter) and future orbital missions.
Sarah N. T. Heine, Herman L. Marshall, Ralf K. Heilmann, Norbert S. Schulz, Kyle Beeks, Francesco Drake, Derek Gaines, Skylar Levey, David L. Windt, and Eric M. Gullikson, "Laboratory progress in soft x-ray polarimetry," Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 1039916 (Presented at SPIE Optical Engineering + Applications: August 10, 2017; Published: 29 August 2017); https://doi.org/10.1117/12.2274205.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon