From Event: SPIE Optical Engineering + Applications, 2017
We have developed a laboratory spectropolarimeter built to characterize the transmissive and reflective polarization properties of the Daniel K. Inouye Solar Telescope (DKIST) optical components. This includes the full Mueller matrix of retarders, polarizers, mirrors, dichroic coatings, and other optical elements that introduce polarization effects. Characterization is performed at various angles of incidence from 400nm to 1650nm with ~9nm spectral resolution and statistical noise limits >5000 using many automated stages. With this data set, we present tolerance analysis of typical as-built DKIST optics.
Stacey R. Sueoka and David M. Harrington, "Visible, near infrared spectropolarimeter for characterization of the DKIST optical system and polarization properties (Conference Presentation)," Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 104070W (Presented at SPIE Optical Engineering + Applications: August 09, 2017; Published: 19 September 2017); https://doi.org/10.1117/12.2274328.5581336785001.
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