The increasingly widespread applications of the Earth observation system information and the rapid development of
modern technologies over the past decades have led to the imposition of remote sensing tools and, in particular, of the
imaging spectrometers. These trends place high demands on the development and improvement of both the systems
themselves and the characterization methods. This paper highlights features that are expected to be considered critical for
imaging spectrometer performance: The basic steps for characterization of imaging spectrometer critical characteristics
are indicated in the flow diagrams. The characterization methods and correspondence correction procedures are
determined and the obtained results are presented.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon