Infrared (IR) propagation through the atmosphere is strongly affected by atmospheric turbulence. To correctly model IR propagation, this turbulence must be well characterized and understood. To that end, this paper presents propagation measurements, including detailed meteorological measurements, which have been made over water along a 16 km propagation path. Variation in meteorological parameters, specifically air temperature, will be studied to determine their effect on measurement parameters. Additionally, Cn2 (refractive structure parameter) measurements were taken in the Mid-Wave Infrared (MWIR) band. A preliminary comparison of measured values to modeled results from IRBLEM (IR Boundary Layer Effects Model) will be presented. The goal of these comparisons is to determine optimum measurement practices and determine the variation in Cn2 given the measured variation in meteorological parameters along the propagation path. Significant work has been done by others to measure and model turbulence and the effects on IR propagation. This paper will contribute to that work by providing an especially well characterized 16 km propagation path along with MWIR Cn2 measurements.
Kathleen Tepfer, Rebekah F. Wilson, and Thomas M. Taczak, "Meteorological measurements to characterize atmospheric turbulence variation," Proc. SPIE 10425, Optics in Atmospheric Propagation and Adaptive Systems XX, 1042504 (Presented at SPIE Remote Sensing: September 13, 2017; Published: 29 September 2017); https://doi.org/10.1117/12.2277936.
Conference Presentations are recordings of oral presentations given at SPIE conferences and published as part of the conference proceedings. They include the speaker's narration along with a video recording of the presentation slides and animations. Many conference presentations also include full-text papers. Search and browse our growing collection of more than 14,000 conference presentations, including many plenary and keynote presentations.
Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon