Nina Schreiner, Wolfgang Sauer-Greff, Ralph Urbansky, and Fabian Friederich, "Multilayer thickness inspection with millimeter-waves (Conference Presentation)," Proc. SPIE 10531, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, 105310P (Presented at SPIE OPTO: January 30, 2018; Published: 14 March 2018); https://doi.org/10.1117/12.2300761.5751516155001.
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