We report on our recent industrial development projects on millimeter-wave and terahertz imaging solutions for non-destructive testing. This involves system realizations as well as their integration in industrial environments.
Fabian Friederich, "Millimeter-wave imaging solutions for non-destructive testing (Conference Presentation)," Proc. SPIE 10531, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, 105310R (Presented at SPIE OPTO: January 30, 2018; Published: 14 March 2018); https://doi.org/10.1117/12.2300758.5751529140001.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon