Guided wave-based monitoring of composite structures plays an important role in the area of structural health monitoring (SHM) of aerospace structures. Adhesively bonded joints have not yet fulfilled current airworthiness requirements; hence, assemblies of carbon fibre-reinforced parts still require mechanical fasteners, and a verified SHM method with reliable disbonding/delamination detection and propagation assessment is needed. This study investigated the disbonding/delamination propagation in adhesively bonded panels using Lamb waves during fatigue tests. Analyses focused on the proper frequency and mode selection, sensor placement and selection of parameter sensitive to the growth of disbonding areas. Piezoelectric transducers placed across the bonded area were used as actuators and sensors. Lamb wave propagation was investigated considering the actual shape of the crack front and the mode of the crack propagation. The actual cracked area was determined by ultrasonic A-scans. A correlation between the crack propagation rate and the A0 mode velocity was found.
Lenka Michalcová, Lukáš Rechcígel, Petr Bělský, and Pavel Kucharský, "Fatigue disbonding analysis of wide composite panels by means of Lamb waves," Proc. SPIE 10599, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII, 105991E (Presented at SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring: March 08, 2018; Published: 27 March 2018); https://doi.org/10.1117/12.2296851.
Conference Presentations are recordings of oral presentations given at SPIE conferences and published as part of the conference proceedings. They include the speaker's narration along with a video recording of the presentation slides and animations. Many conference presentations also include full-text papers. Search and browse our growing collection of more than 14,000 conference presentations, including many plenary and keynote presentations.
Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon