From Event: SPIE Commercial + Scientific Sensing and Imaging, 2018
We report on the design, modeling, calibration, and experimental results of a LWIR, spectrally and temporally resolved broad band bi-directional reflectance distribution function measuring device. The system is built using a commercial Fourier transform infrared spectrometer, which presents challenges due to relatively low power output compared to laser based methods. The instrument is designed with a sample area that is oriented normal to gravity, making the device suitable for measuring loose powder materials, liquids, or other samples that can be difficult to measure in a vertical orientation. The team built a radiometric model designed to understand the trade space available for various design choices as well as to predict instrument success at measuring the target materials. The radiometric model was built by using the output of commercial non sequential raytracing tools combined with a scripted simulation of the interferometer. The trade space identified in this analysis will be presented.
The design was based on moving periscopes with custom off axis parabolas to focus the light onto the sample. The system assembly and alignment will be discussed. The calibration method used for the sensor will be detailed, and preliminary measurements from this research sensor will be presented.
Charles F. LaCasse, Kyle H. Fuerschbach, Julia M. Craven, Jacob W. Segal, John D. van der Laan, Jeremy B. Wright, Steven M. Grover, Jessica M. Pehr, Thomas A. Reichardt, and Thomas J. Kulp, "Long wave infrared spectropolarimetric directional reflectometer (Conference Presentation)," Proc. SPIE 10655, Polarization: Measurement, Analysis, and Remote Sensing XIII, 106550F (Presented at SPIE Commercial + Scientific Sensing and Imaging: April 16, 2018; Published: 14 May 2018); https://doi.org/10.1117/12.2309701.5783307424001.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon