From Event: SPIE Commercial + Scientific Sensing and Imaging, 2018
In future quantum communication systems, single photons will be required to possess very narrow linewidths and accurate wavelengths for efficient interaction with quantum memories. Spectral characterization of such single photon sources is necessary and must be performed with very high spectral resolution, wavelength accuracy and detection sensitivity. We propose a method to precisely characterize the spectral properties of narrow-linewidth single-photon sources using an atomic vapor cell based on electromagnetically-induced transparency. We have experimentally demonstrated a spectral resolution of better than 150 kHz, an absolute wavelength accuracy of within 50 kHz and an exceptional detection sensitivity suitable for optical signals as weak as -117 dBm.
Lijun Ma, Oliver Slattery, and Xiao Tang, "Ultra-high spectral resolution spectrometer for single photon source characterization," Proc. SPIE 10660, Quantum Information Science, Sensing, and Computation X, 1066006 (Presented at SPIE Commercial + Scientific Sensing and Imaging: April 18, 2018; Published: 14 May 2018); https://doi.org/10.1117/12.2303836.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon