From Event: SPIE Commercial + Scientific Sensing and Imaging, 2018
In this work, authors present a new application of electronic speckle pattern shearing interferometry (shearography) to a phenomenon known as creep compliance, which is an important mechanical property of viscoelastic materials. Two different sealing elastomers were tested in a short-term creep experiment, applying a constant tensile stress to a specimen. An experimental in-plane shearography setup was implemented to measure the in-plane creep strains produced in the tested object. In order to show the effectiveness of shearography for the assessment of this viscoelastic mechanical property, results were compared to that obtained with an equipment of Digital Image Correlation (DIC). It was demonstrated that shearography can be potentially and successfully applied to the creep analysis of these kind of materials. Finally, advantages and limitations of this measurement method are discussed.
Juan Benito Pascual-Francisco, Orlando Susarrey huerta, Alexandre Michtchenko, and Omar Barragán Pérez, "Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry ," Proc. SPIE 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII, 106670H (Presented at SPIE Commercial + Scientific Sensing and Imaging: April 18, 2018; Published: 14 May 2018); https://doi.org/10.1117/12.2303899.
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