We investigate ways to improve image resolution and contrast in scatter-plate microscopy by image deconvolution and speckle pattern manipulation. Scatter-plate microscopy uses a single diffusively scattering element instead of a complex lens system to record high resolution images with almost arbitrary magnification. The image of the sample is acquired by cross-correlating the speckle pattern of a point source and the speckle pattern of the incoherently illuminated sample. The working principle is restricted by the finite range of the optical memory effect and by the quality of the light source used to approximate a point source (in our case a single mode fibre). With a deconvolution method using the autocorrelation of the point source speckle pattern as the filter function, describing the relationship between the acquired image and the original object, it is possible to compensate partially the deviation of the used point source from an ideal one. The influence of the restricted range of the memory effect can be reduced by manipulating the sample’s speckle pattern.
Stephan Ludwig, Alok K. Singh, Giancarlo Pedrini, and Wolfgang Osten, "Scatter-plate microscope: improved image acquisition," Proc. SPIE 10677, Unconventional Optical Imaging, 1067717 (Presented at SPIE Photonics Europe: April 24, 2018; Published: 24 May 2018); https://doi.org/10.1117/12.2306252.
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