From Event: SPIE Optical Engineering + Applications, 2018
There are two distinct problems in determining optical surface defects. On one hand, we have a measurable area-based destruction of the wave front. This can be easily classified by optical designers based on contrast loss. On the other hand, we have brightness-based and magnification-dependent aesthetic imperfections. They have to be classified according to their visibility. So far only a dimensional classification of imperfections has been possible in the ISO standard. The integration of ANSI "Scratch & Dig" into the ISO standard offers the possibility to classify aesthetic imperfections with standardized reference plates. This paper will give an introduction to both methods.
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Dirk Jahn, "A designer's point of view on integration of ANSI scratch and dig into ISO surface imperfections," Proc. SPIE 10747, Optical System Alignment, Tolerancing, and Verification XII, 107470F (Presented at SPIE Optical Engineering + Applications: August 19, 2018; Published: 19 September 2018); https://doi.org/10.1117/12.2323899.