From Event: SPIE Optical Engineering + Applications, 2018
A novel, single shot, low cost, multidirectional lateral shear interferometer for extended range wave front sensing has been developed. It exploits the Fresnel diffraction field formed by five lowest diffraction orders of a simple amplitude checker grating. The Fresnel pattern encodes information on four directional partial derivatives of the wavefront under test. It has been theoretically and experimentally shown that for larger gradient phase objects or shear amounts only diagonal derivative information is easily accessible. The x and y direction gradient maps are strongly amplitude modulated. Therefore their demodulation becomes a formidable task. The same feature has been found in widely used quadriwave interferometer developed at ONERA, France. The results of analytical studies and experimental works including fringe pattern processing and phase demodulation are presented.
Łukasz Służewski, Krzysztof Patorski, and Maciej Trusiak, "Amplitude checker grating-based multichannel lateral shear interferometry for extended aberration sensing," Proc. SPIE 10749, Interferometry XIX, 107490N (Presented at SPIE Optical Engineering + Applications: August 22, 2018; Published: 18 August 2018); https://doi.org/10.1117/12.2323648.
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