From Event: SPIE Optical Engineering + Applications, 2018
We report on recent progress in the development of our focal plane imaging system for the detection and characterization of small fabrication errors in diffraction gratings. The instrument uses a purpose-designed high dynamic range imaging method in conjunction with a low-cost digital camera to acquire images with a dynamic range that can now exceed eight orders of magnitude. The sensitivity and utility of the instrument is demonstrated with measurements of three different diffraction gratings. Avenues for further possible improvements of the instrument are discussed.
Sofia C. Corzo-Garcia, Muhammad Imran Afzal, Benjamin T. Kidder, Michelle A. Grigas, and Ulf Griesmann, "A high dynamic range imaging method for the characterization of periodic errors in diffraction gratings," Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 1075009 (Presented at SPIE Optical Engineering + Applications: August 20, 2018; Published: 4 September 2018); https://doi.org/10.1117/12.2321227.
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